Ulrike Kindereit, Gary Woods, Jing Tian, Uwe Kerst, Rainer Leihkauf and Christian Boit (invited): “Quantitative investigation of laser beam modulation in electrically active devices as used in laser voltage probing”, IEEE Transactions on Device and Materials Reliability (TDMR), vol. 7 (1), pages 19-30, 2007.
Ulrike Kindereit, Gary Woods, Jing Tian, Uwe Kerst and Christian Boit: “Investigation of laser voltage probing signals in CMOS transistors”, IEEE Proceedings of the 45th International Reliability Physics Symposium (IRPS), Pheonix, AZ, pages 526-533, 2007.
Ulrike Kindereit, Christian Boit, Uwe Kerst, Steven Kasapi, Radu Ispasoiu, Roy Ng and William Lo: “Comparison of laser voltage probing and mapping results in oversized and minimum size devices of 120 nm and 65 nm technology”, Proceedings of the 19th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), Maastricht, Netherlands, published in Microelectronics Reliability (Elsevier), Volume 48, Issues 8-9, pages 1322-1326, August/September 2008.
Ulrike Kindereit: “Investigation of laser-beam modulations induced by the operation of electronic devices”, Dissertation, Technische Universität Berlin, 2008.
Online-Publikation, verfasst in English, Berlin, 2009, zum Herunterladen bereitgestellt unter:
URL: http://opus.kobv.de/tuberlin/volltexte/2009/2213/
Christian Boit, Rudolf Schlangen, Arkadiusz Glowacki, Ulrike Kindereit, Tuba Kiyan, Uwe Kerst, Ted Lundquist, Steven Kasapi, and H. Suzuki: “Physical IC debug – backside approach and nanoscale challenge”, Advances in Radio Science (ARS), 6, pages 265-272, 2008.
Ulrike Kindereit, Oana Mutihac, Christian Boit and Bernd Tillack: “Spectral resolution of photon emission from SiGe:C heterojunction bipolar transistors (HBTs)”, IEEE Proceedings of the 49th International Reliability Physics Symposium (IRPS), pages 5C.5.1-6, 2011.
Ulrike Kindereit, Alan J. Weger, Franco Stellari, Peilin Song, Hervé Deslandes, Ted Lundquist and Prasad Sabbineni: "Near-infrared photon emission spectroscopy of a 45 nm SOI ring oscillator", IEEE Proceedings of the 50th International Reliability Physics Symposium (IRPS), Anaheim, CA, pages 2D.2.1-7, 2012.
Ulrike Kindereit, Alan J. Weger, Franco Stellari, Peilin Song, Hervé Deslandes, Ted Lundquist and Prasad Sabbineni: "Near-infrared photon emission spectroscopy trends in scaled SOI technologies", Conference Proceedings from the 38th International Symposium for Testing and Failure Analysis (ISTFA), Phoenix, AZ, pages 128-134, ASM International, 2012.
Stellari, Franco, Alan J. Weger, Seongwon Kim, Dzmitry Maliuk, Peilin Song, Herschel Ainspan, Young Kwark, Christian Baks, Ulrike Kindereit, Vikas Anant and Ted R. Lundquist: "A Superconducting Nanowire Single-Photon Detector (SnSPD) System for Ultra Low Voltage Time-Resolved Emission (TRE) Measurements of VLSI Circuits", Conference Proceedings from the 39th International Symposium for Testing and Failure Analysis (ISTFA), San Jose, CA, ASM International, 2013.
Euan Ramsay, Herve Deslandes, Ted Lundquist, Kristen Sunter, Karl Berggren, Vikas Anant, Ulrike Kindereit, Andrea Baghat Shehata, Franco Stellari, Alan J. Weger and Peilin Song: “Logic Analysis Tool”, Proceedings of the 39th Annual Government Microcircuit Applications and Critical Technology (GOMACTech) Conference, Charleston, SC, March 31- April 3, 2014.
Ulrike Kindereit: “Fundamentals and future applications of Laser Voltage Probing”, IEEE Proceedings of the 52nd International Reliability Physics Symposium (IRPS), Waikoloa, HI, pages 3F.1 1-11, 2014.
Patente
Ulrike Kindereit: “LVP/LVI signal enhancement through engineered/modified physical layout features”, patent pending, application number 14/315, 324.
Ulrike Kindereit: “An integrated, solid state, precision temperature control solution for use with a DUT on Failure Analysis equipment”, patent pending, application number 14/142, 721.
Ulrike Kindereit: “Tunable wavelength laser voltage probing”, patent pending, application number 155123.
Ulrike Kindereit: “Tunable wavelength dynamic laser stimulation”, patent pending, application number 155136.
